A practical guide for X-ray diffraction characterization of Ga(Al, In)N alloys

Chinese Physics Letters

Volumn 22, Issue 8, 2005, Pages 1984-1986

  Zhou, Sheng Qiang ^a   Wu, Ming Fang ^a   Yao, Shu De ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; III-V SEMICONDUCTORS; LATTICE MISMATCH; SEMICONDUCTOR ALLOYS; X RAY DIFFRACTION;

ACTIVE LAYER; CHEMICAL COMPOSITIONS; CLADDING LAYER; CRYSTALLINE QUALITY; DEVICE PERFORMANCE; EMISSION WAVELENGTH; LIGHTEMITTING DIODE; PRACTICAL GUIDE; RESIDUAL STRAINS; X- RAY DIFFRACTIONS;

GALLIUM NITRIDE;

EID: 23844465705     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/22/8/045     Document Type: Article

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