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Volumn 87, Issue 4, 2005, Pages
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Cross-sectional Raman spectra of InN epifilms
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER SATURATION;
CROSS-RESIDUAL RAMAN SPECTROSCOPY;
INN EPIFILMS;
TRANSITION METAL SILICIDES;
WAFER CURVATURE MEASUREMENT;
ELECTRONIC STRUCTURE;
FIELD EFFECT TRANSISTORS;
GERMANIUM COMPOUNDS;
MICROELECTROMECHANICAL DEVICES;
RAMAN SCATTERING;
RESIDUAL STRESSES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 23744502237
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2001137 Document Type: Article |
Times cited : (45)
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References (12)
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