-
1
-
-
0035075840
-
Topography measurement by a reliable large-area curvature sensor
-
M. Schulz, "Topography measurement by a reliable large-area curvature sensor," Optik, 112 (2000) 86-90.
-
(2000)
Optik
, vol.112
, pp. 86-90
-
-
Schulz, M.1
-
2
-
-
0033658793
-
A facility for the curvature-based measurement of the nanotopography of complex surfaces
-
P. Thomsen-Schmidt, M. Schulz, I. Weingärtner, "A facility for the curvature-based measurement of the nanotopography of complex surfaces," Proc. SPIE 4098 (2000) 94-101.
-
(2000)
Proc. SPIE
, vol.4098
, pp. 94-101
-
-
Thomsen-Schmidt, P.1
Schulz, M.2
Weingärtner, I.3
-
3
-
-
0141731120
-
Measurement of steep aspheres by curvature scanning: An uncertainty budget
-
M. Schulz, I. Weingärtner, "Measurement of steep aspheres by curvature scanning: an uncertainty budget," Proc. EUSPEN 1 (2001) 478-481.
-
(2001)
Proc. EUSPEN
, vol.1
, pp. 478-481
-
-
Schulz, M.1
Weingärtner, I.2
-
4
-
-
0028755772
-
Computer - Controlled high accuracy optical measurement
-
M. Schulz, "Computer - controlled high accuracy optical measurement," Proc. SPIE 2248 (1994) 381-390.
-
(1994)
Proc. SPIE
, vol.2248
, pp. 381-390
-
-
Schulz, M.1
-
5
-
-
0036316077
-
Reconstructing surface profiles from curvature measurements
-
C. Elster, J. Gerhard, P. Thomsen-Schmidt, M. Schulz, I. Weingärtner, "Reconstructing surface profiles from curvature measurements," Optik 114 (2002) 154-158.
-
(2002)
Optik
, vol.114
, pp. 154-158
-
-
Elster, C.1
Gerhard, J.2
Thomsen-Schmidt, P.3
Schulz, M.4
Weingärtner, I.5
-
6
-
-
0141842491
-
Free-form measurement with high lateral resolution
-
M. Schulz, I. Weingärtner, "Free-form measurement with high lateral resolution," Proc. EUSPEN (2002) 621-624.
-
(2002)
Proc. EUSPEN
, pp. 621-624
-
-
Schulz, M.1
Weingärtner, I.2
-
7
-
-
0001080578
-
Measurement of large plane surface shapes by connecting small-aperture interferograms
-
M. Otsubo, K. Okada, J. Tsujiuchi, "Measurement of large plane surface shapes by connecting small-aperture interferograms," Opt. Eng. 33 (1994) 608-613.
-
(1994)
Opt. Eng.
, vol.33
, pp. 608-613
-
-
Otsubo, M.1
Okada, K.2
Tsujiuchi, J.3
-
8
-
-
58749113677
-
Stitching interferometer for large piano optics using a standard interferometer
-
M. Bray, "Stitching interferometer for large piano optics using a standard interferometer," Proc. SPIE 3134 (1997) 39-50.
-
(1997)
Proc. SPIE
, vol.3134
, pp. 39-50
-
-
Bray, M.1
-
9
-
-
0030720424
-
Stitching interferometry for the measurement of aspheric surfaces
-
Y. J. Fan, K. G. Stuik, P. C. Mulders, C. H. F. Velzel, "Stitching interferometry for the measurement of aspheric surfaces," Ann. CIRP 46 (1997) 459-462.
-
(1997)
Ann. CIRP
, vol.46
, pp. 459-462
-
-
Fan, Y.J.1
Stuik, K.G.2
Mulders, P.C.3
Velzel, C.H.F.4
-
10
-
-
0032660619
-
Stitching interferometry: How and why it works
-
M. Bray, "Stitching interferometry: how and why it works," Proc. SPIE 3739 (1999) 259-273.
-
(1999)
Proc. SPIE
, vol.3739
, pp. 259-273
-
-
Bray, M.1
-
11
-
-
0035760744
-
Stitching interferometry of aspherical surfaces
-
T. Hänsel, A. Nickel, A. Schindler, "Stitching interferometry of aspherical surfaces," Proc. SPIE, 4449 (2001) 265-275.
-
(2001)
Proc. SPIE
, vol.4449
, pp. 265-275
-
-
Hänsel, T.1
Nickel, A.2
Schindler, A.3
-
12
-
-
0035761741
-
Stitching interferometry and absolute surface shape metrology: Similarities
-
M. Bray, "Stitching interferometry and absolute surface shape metrology: similarities," Proc. SPIE 4451 (2001) 375-383.
-
(2001)
Proc. SPIE
, vol.4451
, pp. 375-383
-
-
Bray, M.1
-
13
-
-
0038302716
-
3-D surface profile measurement of large x-ray synchrotron radiation mirrors using stitching interferometry
-
in print
-
L. Assoufid, M. Bray, J. Quian, D. Shu, "3-D surface profile measurement of large x-ray synchrotron radiation mirrors using stitching interferometry," Proc. SPIE 4782 (2002), in print.
-
(2002)
Proc. SPIE
, vol.4782
-
-
Assoufid, L.1
Bray, M.2
Quian, J.3
Shu, D.4
-
14
-
-
0036465163
-
Stitching interferometric measurement data for inspection of large optical components
-
M. Sjödahl, B. F. Oreb, "Stitching interferometric measurement data for inspection of large optical components," Opt. Eng. 41 (2002) 403-408.
-
(2002)
Opt. Eng.
, vol.41
, pp. 403-408
-
-
Sjödahl, M.1
Oreb, B.F.2
-
15
-
-
26144470147
-
Stitching Interferometrie und Stitching Verfahren
-
Münster, Germany
-
I. Weingärtner, R. D. Geckeier, H. Winkler. M. Schulz, C. Elster, J. Gerhardt, C. Hellwig, I. Rieck, E. Lehberger, "Stitching Interferometrie und Stitching Verfahren," Meeting of the Deutsche Gesellschaft für angewandte Optik (DGaO), Münster, Germany (2003).
-
(2003)
Meeting of the Deutsche Gesellschaft für Angewandte Optik (DGaO)
-
-
Weingärtner, I.1
Geckeier, R.D.2
Winkler, H.3
Schulz, M.4
Elster, C.5
Gerhardt, J.6
Hellwig, C.7
Rieck, I.8
Lehberger, E.9
-
16
-
-
84975624677
-
Method for subaperture testing interferogram reduction
-
W. W. Chow, G. N. Lawrence, "Method for subaperture testing interferogram reduction," Optics Letters 8 (1983) 468-470.
-
(1983)
Optics Letters
, vol.8
, pp. 468-470
-
-
Chow, W.W.1
Lawrence, G.N.2
-
17
-
-
0020939561
-
Full aperture testing with subaperture test optics
-
J. G. Thunen, O. Y. Kwon, "Full aperture testing with subaperture test optics," Proc. SPIE 351 (1983) 19-27.
-
(1983)
Proc. SPIE
, vol.351
, pp. 19-27
-
-
Thunen, J.G.1
Kwon, O.Y.2
-
18
-
-
0021613291
-
The testing of large telescope systems using multiple subapertures
-
T. W. Stuhlinger, "The testing of large telescope systems using multiple subapertures," Proc. SPIE 440 (1983) 91-98.
-
(1983)
Proc. SPIE
, vol.440
, pp. 91-98
-
-
Stuhlinger, T.W.1
-
19
-
-
0021596870
-
Analysis of subaperture testing data
-
1083
-
W. W. Chow, G. N. Lawrence, "Analysis of subaperture testing data," Proc. SPIE 440 (1083) 99-105.
-
Proc. SPIE
, vol.440
, pp. 99-105
-
-
Chow, W.W.1
Lawrence, G.N.2
-
20
-
-
0021576409
-
Influence of higher order noise in wavefront reconstruction
-
G. N. Lawrence, W. W. Chow, "Influence of higher order noise in wavefront reconstruction," Proc. SPIE 440 (1983) 106-108.
-
(1983)
Proc. SPIE
, vol.440
, pp. 106-108
-
-
Lawrence, G.N.1
Chow, W.W.2
-
21
-
-
0021389877
-
Subaperture testing approaches: A comparison
-
S. C. Jensen, W. W. Chow, G. N. Lawrence, "Subaperture testing approaches: a comparison," Appl. Opt. 23 (1984) 740-745.
-
(1984)
Appl. Opt.
, vol.23
, pp. 740-745
-
-
Jensen, S.C.1
Chow, W.W.2
Lawrence, G.N.3
-
22
-
-
0021444922
-
Subaperture optical system testing
-
J. E. Negro, "Subaperture optical system testing," Appl. Opt. 23 (1984) 1921-1930.
-
(1984)
Appl. Opt.
, vol.23
, pp. 1921-1930
-
-
Negro, J.E.1
-
23
-
-
84975648115
-
Numerical processing of dynamic subaperture testing measurements
-
C. R. De Hainaut, A. Erteza, "Numerical processing of dynamic subaperture testing measurements," Appl. Opt. 25 (1986) 503-509.
-
(1986)
Appl. Opt.
, vol.25
, pp. 503-509
-
-
De Hainaut, C.R.1
Erteza, A.2
-
24
-
-
0022908125
-
Subaperture optical testing: Experimental verification
-
T. W. Stuhlinger, Subaperture optical testing: experimental verification," Proc. SPIE 656 (1986) 118-127.
-
(1986)
Proc. SPIE
, vol.656
, pp. 118-127
-
-
Stuhlinger, T.W.1
-
25
-
-
0020873552
-
Rotating scan interferometer
-
P. Langenbeck, "Rotating scan interferometer," Prof. SPIE 396 (1983) 99-101.
-
(1983)
Prof. SPIE
, vol.396
, pp. 99-101
-
-
Langenbeck, P.1
-
26
-
-
26144449504
-
-
"Method of examining an optical component," US Patent 5004346
-
M. Küchel, "Method of examining an optical component," US Patent 5004346 (1988).
-
(1988)
-
-
Küchel, M.1
-
27
-
-
84975635694
-
Subaperture testing of aspheres with annular zones
-
Y.-M. Liu, G. N. Lawrence, C. L. Koliopoulos, "Subaperture testing of aspheres with annular zones," Appl. Opt. 27 (1988) 4504-4513.
-
(1988)
Appl. Opt.
, vol.27
, pp. 4504-4513
-
-
Liu, Y.-M.1
Lawrence, G.N.2
Koliopoulos, C.L.3
-
28
-
-
0000658171
-
Testing aspheric surfaces using multiple annular interferograms
-
M. Melozzi, L. Pezzati, A. Mazzoni, "Testing aspheric surfaces using multiple annular interferograms," Opt. Eng. 32 (1993) 107-1079.
-
(1993)
Opt. Eng.
, vol.32
, pp. 1073-1079
-
-
Melozzi, M.1
Pezzati, L.2
Mazzoni, A.3
-
29
-
-
26144431896
-
System of four distance sensors for high-accuracy measurement of topography
-
submitted for publication
-
I. Weingärtner, C. Elster, "System of four distance sensors for high-accuracy measurement of topography," Prec. Eng., submitted for publication.
-
Prec. Eng.
-
-
Weingärtner, I.1
Elster, C.2
-
30
-
-
2342626347
-
-
IMSL, Visual Numerics, Inc., Corporate Headquarters, 1300 W Sam Houston Pkwy., Ste 150, Houston, Texas 77042-4548, U.S.
-
IMSL, Visual Numerics, Inc., Corporate Headquarters, 1300 W Sam Houston Pkwy., Ste 150, Houston, Texas 77042-4548, U.S.
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