Stitching interferometry: How and why it works

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3739, Issue , 1999, Pages 259-273

  Bray, Michael ^a  

^a CILAS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (OPTICAL); MEASUREMENT ERRORS;

POWER SPECTRAL DENSITY (PSD); STITCHING INTERFEROMETRY;

INTERFEROMETRY;

EID: 0032660619     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)