Stitching interferometry for the measurement of aspheric surfaces

CIRP Annals - Manufacturing Technology

Volumn 46, Issue 1, 1997, Pages

  Fan, Y J ^a   Struik, K G ^a   Mulders, P C ^a   Velzel, C H F ^b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Aspheric optical surface; Interferometry; Measurement

Indexed keywords

ASPHERICS; OPTICAL VARIABLES MEASUREMENT;

STITCHING INTERFEROMETRY;

INTERFEROMETRY;

EID: 0030720424     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0007-8506(07)60865-8     Document Type: Article

References (11)

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