Stitching interferometry and absolute surface shape metrology: Similarities

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4451, Issue , 2001, Pages 375-383

  Bray, Michael ^a  

^a MB Optique   (France)

Author keywords

Absolute surface shape metrology; Interferometry; Stitching interferometry

Indexed keywords

CALIBRATION; COMPUTER SOFTWARE; FIBER OPTIC COMPONENTS; INTERFEROMETERS; LIGHT REFLECTION; LIGHT TRANSMISSION; MEASUREMENT ERRORS;

ABSOLUTE SURFACE SHAPE METROLOGY; STITCHING INTERFEROMETRY;

INTERFEROMETRY;

EID: 0035761741     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.453636     Document Type: Conference Paper

References (5)

1. Michael Bray, "Stitching interferometry for large components using a standard interferometer: Description of an automated system", Second Annual International Conference on Solid State Lasers for Application to Inertial Confinement Fusion (ICF), Europto series, SPIE, Vol. 3047, Paris, 1996.
2. Michael Bray, "Stitching interferometer for large plano optics using a standard interferometer", Optical Manufacturing and Testing II, SPIE, Vol. 3134, San Diego, 1997.
3. Michael Bray, "Stitching interferometer for large optics: Recent developments of a system", Third Annual International Conference on Solid State Lasers for Application to Inertial Confinement Fusion (ICF), Europto series, SPIE, Vol. 3492, Monterey, 1998.
4. Michael Bray, "Stitching Interferometry: Side effects and PSD", Optical Manufacturing and Testing III, SPIE, Vol. 3782, Denver, 1999.
5. J. Schwider et al, "Ein Interferenzverfahren Zur Absolutprüfung Von Planflächennormalen I", Optica Acta, Vol. 13, No 2 (1966)