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Volumn 415, Issue 6874, 2002, Pages 844-845
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Microscopy: Extra dimension with X-rays
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROMETERS;
MICROSCOPIC EXAMINATION;
MODIFICATION;
X RAYS;
X RAY IMAGING;
MATERIALS SCIENCE;
THREE-DIMENSIONAL MODELING;
X-RAY;
COMPUTER ASSISTED TOMOGRAPHY;
CRYSTAL STRUCTURE;
PRIORITY JOURNAL;
SHORT SURVEY;
X RAY ANALYSIS;
X RAY DIFFRACTION;
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EID: 0037148853
PISSN: 00280836
EISSN: None
Source Type: Journal
DOI: 10.1038/415844a Document Type: Short Survey |
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Times cited : (4)
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References (7)
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