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Acta Materialia

Volumn 45, Issue 1, 1997, Pages 105-112

Scaling of microstructural parameters: Misorientations of deformation induced boundaries

(4) Hughes, D A a Liu, Q b Chrzan, D C c Hansen, N b

a SANDIA NATIONAL LABORATORIES (United States)

b TECHNICAL UNIVERSITY OF DENMARK (Denmark)

c Lawrence Berkeley National Laboratory (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); FILM GROWTH; GRAIN BOUNDARIES; NUCLEATION; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

AVERAGE ANGLE; DEFORMATION MICROSTRUCTURE; SCALING HYPOTHESIS; THIN FILM GROWTH;

THIN FILMS;

EID: 0030819332 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(96)00153-X Document Type: Article

Times cited : (344)

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