Automatic and interactive correlation partitioning compared: application to TiN/Ti/SiO2

Surface and Interface Analysis

Volumn 25, Issue 5, 1997, Pages 335-340

  Haigh, S ^a   Kenny, P G ^a   Roberts, R H ^a   Barkshire, I R ^a   Prutton, M ^a   Skinner, D K ^a   Pearson, P ^a   Stribley, K ^a  

^a UNIVERSITY OF BRADFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; INTERFACES (MATERIALS); ION BEAMS; SILICA; SURFACE STRUCTURE; TITANIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUTOMATIC CORRELATION PARTITIONING; INTERACTIVE CORRELATION PARTITIONING;

AUGER ELECTRON SPECTROSCOPY;

EID: 0031143645     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199705)25:5<335::AID-SIA241>3.0.CO;2-9     Document Type: Article

References (21)