A pattern recognition technique for the analysis of grain boundary structure by HREM

Ultramicroscopy

Volumn 62, Issue 1-2, 1996, Pages 15-27

  Paciornik, S ^a   Kilaas, R ^a   Turner, J ^a   Dahmen, U ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; FUNCTIONS; GRAIN BOUNDARIES; IMAGING TECHNIQUES; INTERFACES (MATERIALS);

CONVENTIONAL CONTRAST TECHNIQUES; CROSS CORRELATION FUNCTIONS; MIRROR SLIDE SYMMETRY; RIGID BODY DISPLACEMENTS;

PATTERN RECOGNITION;

ARTICLE; ELECTRON MICROSCOPY; PATTERN RECOGNITION;

EID: 0029896497     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(95)00084-4     Document Type: Article

References (20)

1. A. Ourmazd, F.H. Baumann, M. Bode and Y. Kim, Ultramicroscopy 34 (1990) 237.
2. A.P. Sutton and V. Vitek, Phil. Trans. Roy. Soc. (London) A 309 (1983) 1.
3. A.P. Sutton and V. Vitek, Phil. Trans. Roy. Soc. (London) A 309 (1983) 37.
4. R.C. Gonzalez and R.E. Woods, Digital Image Processing (Addison-Wesley, Reading, MA, 1993).
5. R. Kilaas, S. Paciornik, A.J. Schwartz and L. Tanner, J. Comput. Ass. Microsc. 6 #3 (1994) 129.
6. M.J. Hytch and W.M. Stobbs, Microsc. Microanal. Microstruct. 5 (1994) 133.
7. Gatan, Inc., 6678 Owens Drive, Pleasanton, CA 94588, USA.
8. S. Paciornik, R. Kilaas and U. Dahmen, Ultramicroscopy 50 (1993) 255.
9. U. Dahmen, S. Paciornik, I.G. Solórzano and J.B. Vandersande, Interf. Sci. 2 (1994) 127.
10. M.F. Ashby, F. Spaepen and S. Williams, Acta Met. 26 (1978) 1647.
11. A.P. Sutton, Acta Met. 36 (1988) 1291.
12. A.P. Sutton, Phil. Mag. Lett. 59 (1989) 53.
13. R.W. Balluffi, M. Rühle and A.P. Sutton, Mater. Sci. Eng. 89 (1987) 1.
14. J.M. Penisson and T. Nowicki, J. Physique, Coll. 51 (1990) C1-305.
15. A.R. Smith and L. Eyring, Ultramicroscopy 8 (1982) 65.
16. R.C. Pond, D.A. Smith and V. Vitek, Scripta Met. 12 (1978) 699.
17. W.E. King and G.E. Campbell, MRS Symp. Proc. 295 (1993) 83.
18. G.H. Campbell, W.L. Wien, W.E. King, S.M. Foiles and M. Rühle, Ultramicroscopy 51 (1993) 247.
19. T. Höche, P.R. Kenway, H.J. Kleebe, M. Rühle and P.A. Morris, J. Am. Ceram. Soc. 77 (1994) 339.
20. W.E. King and G.H. Campbell, Ultramicroscopy 51 (1993) 128.