A fuzzy logic approach to edge detection in HREM images of III-V crystals

Information Sciences

Volumn 93, Issue 3-4, 1996, Pages 321-338

  Hillebrand, R ^a   Wang, P P ^b   Gosele U ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; EDGE DETECTION; ELECTRON MICROSCOPY; FORMAL LOGIC; SEMICONDUCTING GALLIUM ARSENIDE;

AL/GAAS; HIGH-RESOLUTION ELECTRON MICROGRAPHS;

FUZZY SETS;

EID: 0030243511     PISSN: 00200255     EISSN: None     Source Type: Journal    
DOI: 10.1016/0020-0255(96)88796-2     Document Type: Article

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