Scaling limits and reliability of SOI CMOS technology (invited)

Journal of Physics: Conference Series

Volumn 10, Issue 1, 2005, Pages 1-6

  Ioannou, D E ^a  

^a Krasnow Institute for Advanced Study   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22544445284     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/10/1/001     Document Type: Article

References (18)

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