Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 5 A, 2005, Pages 3235-3239

  Park, June Ki ^a   Kim, Ji Eun ^a   Han, Chang Soo ^a  

^a Korea Institute of Machine and Materials   (South Korea)

Author keywords

AFM; Alignment angle; Carbon nanotube; Dielectrophoresis; Electric field

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTROPHORESIS; IMAGING TECHNIQUES; SENSORS; SILICON;

AFM; ALIGNMENT ANGLE; DIELECTROPHORESIS; SILICON TIP;

CARBON NANOTUBES;

EID: 22544439341     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.3235     Document Type: Article

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