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Volumn 45, Issue 1, 1998, Pages 338-340

Integration of InAlAs/InGaAs/InP enhancement-and depletion-mode high electron mobility transistors for high-speed circuit applications

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EID: 21744447345     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.658854     Document Type: Article
Times cited : (18)

References (10)
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    • N. Harada, S. Kuroda, and K. Hikosaka, "N-InAlAs/InGaAs HEMT DCFL inverter fabricated using Pt-based gate and photochemical dry etching," IEICE Trans., vol. 10, pp. 1165-1171, 1992.
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  • 2
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    • N. Harada, S. Kuroda, Y. Watanabe, and K. Hikosaka, "Frequency divider using InAlAs/InGaAs HEMT DCFL-NOR gates," Electron. Lett., vol. 29, pp. 2100-2101, 1993.
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  • 5
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    • High-performance InP-based enhancement-mode HEMT's using nonalloyed ohmic contacts and Pt-based buried-gate technologies, vol. 43, pp. 252-257, 1996.
    • K. Chen, T. Enoki, K. Maezawa, K. Aral, and M. Yamamoto, "High-performance InP-based enhancement-mode HEMT's using nonalloyed ohmic contacts and Pt-based buried-gate technologies," IEEE Trans. Electron. Devices, vol. 43, pp. 252-257, 1996.
    • IEEE Trans. Electron. Devices
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  • 6
    • 3242840395 scopus 로고    scopus 로고
    • High-performance enhacement mode high electron mobility transistors (E-HEMT's) lattice matched to InP, vol. 32, pp. 1037-1038, 1996.
    • A. Mahajan, P. Fay, C. Caneau, and I. Adesida, "High-performance enhacement mode high electron mobility transistors (E-HEMT's) lattice matched to InP," Electron. Lett., vol. 32, pp. 1037-1038, 1996.
    • Electron. Lett.
    • Mahajan, A.1    Fay, P.2    Caneau, C.3    Adesida, I.4
  • 7
    • 0026908331 scopus 로고    scopus 로고
    • Process for enhancement/depletion-mode GaAs/InGaAs/AlGaAs pseudomorphic MODFET's using selective wet gate recessing, vol. 28, pp. 1633-1634, 1992.
    • M. Tong, K. Nummila, J.-W. Seo, A. Ketterson, and I. Adesida, "Process for enhancement/depletion-mode GaAs/InGaAs/AlGaAs pseudomorphic MODFET's using selective wet gate recessing," Electron. Lett., vol. 28, pp. 1633-1634, 1992.
    • Electron. Lett.
    • Tong, M.1    Nummila, K.2    Seo, J.-W.3    Ketterson, A.4    Adesida, I.5
  • 8
    • 0026940016 scopus 로고    scopus 로고
    • InAlAs/InGaAs/InP MODFET's with uniform threshold voltage obtained by selective wet gate recess, vol. 13, pp. 525-527, 1992.
    • M. Tong, K. Nummila, A. Ketterson, I. Adesida, C. Caneau, and R. Bhat, "InAlAs/InGaAs/InP MODFET's with uniform threshold voltage obtained by selective wet gate recess," IEEE Electron. Device Lett., vol. 13, pp. 525-527, 1992.
    • IEEE Electron. Device Lett.
    • Tong, M.1    Nummila, K.2    Ketterson, A.3    Adesida, I.4    Caneau, C.5    Bhat, R.6
  • 9
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    • Mesa-sidewall gate leakage in InAlAs/InGaAs heterostructure field-effect transistors, vol. 39, pp. 2037-2043, 1992.
    • S. Bahl, M. Leary, and J. del Alamo, "Mesa-sidewall gate leakage in InAlAs/InGaAs heterostructure field-effect transistors," IEEE Trans. Electron. Devices, vol. 39, pp. 2037-2043, 1992.
    • IEEE Trans. Electron. Devices
    • Bahl, S.1    Leary, M.2    Del Alamo, J.3
  • 10
    • 0022807083 scopus 로고    scopus 로고
    • GaAs/AlGaAs and InGaAs/AlGaAs MODFET inverter simulations, 33, pp. 1626-1634, 1986.
    • A. Ketterson and H. Morkoc, "GaAs/AlGaAs and InGaAs/AlGaAs MODFET inverter simulations," IEEE Trans. Electron. Devices, vol. ED-33, pp. 1626-1634, 1986.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.