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Volumn 29, Issue 24, 1993, Pages 2100-2101

Frequency divider using InAIAs/InGaAs HEMT DCFL-NOR gates

Author keywords

Frequency dividers; High electron mobility transistors

Indexed keywords

CASCADE CONNECTIONS; GATES (TRANSISTOR); HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUIT TESTING; ION IMPLANTATION; PERFORMANCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING;

EID: 0027696288     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19931404     Document Type: Article
Times cited : (6)

References (13)
  • 3
    • 0024700153 scopus 로고
    • Threshold voltage of submicrometre Gating 53As HIGFETs
    • FEUER, M.D., SHUNK, S.C., KUO, J.M., TENNANT, D.M., and TELL, B.: ‘Threshold voltage of submicrometre Gating 53As HIGFETs’, Electron. Lett., 1989, 25, (15), pp. 975-976
    • (1989) Electron. Lett. , vol.25 , Issue.15 , pp. 975-976
    • FEUER, M.D.1    SHUNK, S.C.2    KUO, J.M.3    TENNANT, D.M.4    TELL, B.5
  • 4
    • 0024753983 scopus 로고
    • Short-channel effects in sub-quarter-micrometre-gate HEMTs: Simulation and experiment
    • AWANO, Y., KOSUGI, M., KOSEMURA, K., MIMURA, T., and ABE, M.: ‘Short-channel effects in sub-quarter-micrometre-gate HEMTs: Simulation and experiment’, IEEE Trans., 1989, ED-36, (10), pp. 2260-2266
    • (1989) IEEE Trans. , vol.ED-36 , Issue.10 , pp. 2260-2266
    • AWANO, Y.1    KOSUGI, M.2    KOSEMURA, K.3    MIMURA, T.4    ABE, M.5
  • 6
    • 0040145380 scopus 로고
    • N-InAlAs/lnGaAs HEMT DCFL inverter fabricated using Pt-based gate and photochemical dry etching
    • HARADA, N., KURODA, S. and HIKOSAKA, K.: ‘N-InAlAs/lnGaAs HEMT DCFL inverter fabricated using Pt-based gate and photochemical dry etching’, 1EICE Trans., 1992, E7S-C, (10), pp. 1165-1171
    • (1992) 1EICE Trans. , vol.E7S-C , Issue.10 , pp. 1165-1171
    • HARADA, N.1    KURODA, S.2    HIKOSAKA, K.3
  • 7
    • 0344541638 scopus 로고
    • Selective photochemical dry etching of GaAs/AlGaAs and InGaAs/lnAlAs heterostructures
    • KOSUGI, M., KURODA, S., HARADA, N., and KATAKAMI, T.: ‘Selective photochemical dry etching of GaAs/AlGaAs and InGaAs/lnAlAs heterostructures’, Electron. Lett., 1991, 27, (23), pp. 2113-2115
    • (1991) Electron. Lett. , vol.27 , Issue.23 , pp. 2113-2115
    • KOSUGI, M.1    KURODA, S.2    HARADA, N.3    KATAKAMI, T.4
  • 8
    • 0026817486 scopus 로고
    • Highly uniform N-InAlAs/InGaAs HEMT's on a 3-in InP substrate using photochemical selective dry recess etching
    • KURODA, S., IMANISHI, K., HARADA, N., HIKOSAKA, K., and ABE, M.: ‘Highly uniform N-InAlAs/InGaAs HEMT's on a 3-in InP substrate using photochemical selective dry recess etching’, IEEE Electron Device Lett., 1992, 13, (2), pp. 105-107
    • (1992) IEEE Electron Device Lett. , vol.13 , Issue.2 , pp. 105-107
    • KURODA, S.1    IMANISHI, K.2    HARADA, N.3    HIKOSAKA, K.4    ABE, M.5
  • 10
    • 0021386127 scopus 로고
    • High-speed frequency dividers using GaAs/GaAlAs high-electron-mobility transistors
    • LEE, C.P., LEE, S.J., HOU, D., MILLER, D.L., ANDERSON, R.J., and SHENG, N.H.: ‘High-speed frequency dividers using GaAs/GaAlAs high-electron-mobility transistors’, Electron. Lett., 1984, 20, (5), pp. 217-218
    • (1984) Electron. Lett. , vol.20 , Issue.5 , pp. 217-218
    • LEE, C.P.1    LEE, S.J.2    HOU, D.3    MILLER, D.L.4    ANDERSON, R.J.5    SHENG, N.H.6
  • 12
    • 0020089663 scopus 로고
    • Gigabit logic operation with enhancement-mode GaAs MESFET IC's
    • MIZUTANI, T., KATO, N., OSAFUNE, K., and OHMORI, M.: ‘Gigabit logic operation with enhancement-mode GaAs MESFET IC's’, IEEE Trans., 1982, ED-29, (2), pp. 199-204
    • (1982) IEEE Trans. , vol.ED-29 , Issue.2 , pp. 199-204
    • MIZUTANI, T.1    KATO, N.2    OSAFUNE, K.3    OHMORI, M.4
  • 13
    • 0024011522 scopus 로고
    • Current-gain cutoff frequency comparison of InGaAs HEMT's
    • HIKOSAKA, K., SASA, S., HARADA, N., and KURODA, S.: ‘Current-gain cutoff frequency comparison of InGaAs HEMT's’, IEEE Electron Device Lett., 1988, 9, (5), pp. 241-243
    • (1988) IEEE Electron Device Lett. , vol.9 , Issue.5 , pp. 241-243
    • HIKOSAKA, K.1    SASA, S.2    HARADA, N.3    KURODA, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.