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Volumn 81, Issue 3, 2005, Pages 561-564
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Formation of thermally stable low-resistance Ti/W/Au ohmic contacts on n-type GaN
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Author keywords
[No Author keywords available]
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Indexed keywords
ACETONE;
ANNEALING;
CARRIER CONCENTRATION;
CURRENT VOLTAGE CHARACTERISTICS;
DEPOSITION;
HALL EFFECT;
METALLIZING;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
OHMIC CONTACTS;
SURFACE TREATMENT;
BUFFERED OXIDE ETCH (BOE);
ELECTRON BEAM EVAPORATION;
METAL DEPOSITION;
SURFACE OXIDES;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 21644482411
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-004-2673-3 Document Type: Article |
Times cited : (4)
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References (21)
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