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Volumn 81, Issue 3, 2005, Pages 561-564

Formation of thermally stable low-resistance Ti/W/Au ohmic contacts on n-type GaN

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; ANNEALING; CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; HALL EFFECT; METALLIZING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OHMIC CONTACTS; SURFACE TREATMENT;

EID: 21644482411     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2673-3     Document Type: Article
Times cited : (4)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.