Erratum: Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO 2 by ion implantation (Journal of Applied Physics (2004) 96 (4952))

Journal of Applied Physics

Volumn 97, Issue 8, 2005, Pages

  Zuk, J ^a   Krzyanowska, H ^a   Clouter, M J ^b   Bromberek, M ^b   Bubert, H ^c   Rebohle, L ^d   Skorupa, W ^d  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

^b MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^c LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^d INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21544439868     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1874305     Document Type: Erratum

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