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Volumn 29, Issue 3, 2003, Pages 202-214

Reactions induced by low energy electrons in cryogenic films (Review)

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; CHLORINE COMPOUNDS; CRYOGENICS; DAMAGE DETECTION; ELECTRIC EXCITATION; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON IRRADIATION; ELECTRON SCATTERING; ELECTRONS; ELECTROSTATIC DEVICES; ENERGY DISSIPATION; INDUCED POLARIZATION LOGGING; MOLECULES; MONOLAYERS; MORPHOLOGY; MULTILAYERS; NEGATIVE IONS; PHOTODISSOCIATION; SILICON COMPOUNDS; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 21144450152     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1542441     Document Type: Article
Times cited : (40)

References (102)
  • 35
    • 0003828439 scopus 로고
    • Pratical surface analysis
    • D. Briggs and M. P. Seah (Eds.) John Wiley, Chichister, U.K.
    • D. Briggs and M. P. Seah, Pratical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy 2nd, D. Briggs and M. P. Seah (Eds.) John Wiley, Chichister, U.K., Vol. 1 (1990).
    • (1990) Auger and X-ray Photoelectron Spectroscopy 2nd , vol.1
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.