An improved electron transmission method for measuring electron trapping cross sections at the surface of dielectric films

Review of Scientific Instruments

Volumn 68, Issue 10, 1997, Pages 3883-3889

  Nagesha, K ^a   Gamache, J ^a   Bass, A D ^a   Sanche, L ^a  

^a UNIVERSITY OF SHERBROOKE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON GUNS; IONS; KRYPTON; MOLECULES; MONOCHROMATORS; MONOLAYERS; SURFACES;

CHARGE TRAPPING; DISSOCIATIVE ELECTRON ATTACHMENT; ELECTRON BOMBARDMENT; ELECTRON STIMULATED DESORPTION; INJECTION CURVE; LOW ENERGY ELECTRON TRANSMISSION; ZERO ENERGY REFERENCE;

DIELECTRIC FILMS;

EID: 0031256696     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148042     Document Type: Article

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