Metrologische Rastersondenmikroskope - Messgeräte für die dimensionelle Nanometrologie

PTB - Mitteilungen Forschen und Prufen

Volumn 114, Issue 1, 2004, Pages 5-15

  Danzebrink, Hans Ulrich ^a   Pohlenz, Frank ^a   Dai, Gaoliang ^a   Dal Savio, Claudio ^a  

^a PTB Arbeitsgruppe Quantit R ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2042471486     PISSN: 0030834X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (22)

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