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Applied Physics A: Materials Science and Processing

Volumn 76, Issue 6, 2003, Pages 889-892

Optical microscope with snom option for micro- and nanoanalytical investigations at low temperatures

(5) Danzebrink, H U a Kazantsev, D V a Dal Savio, C a Pierz, K a Guttler B a

a PHYSIKALISCH TECHNISCHE BUNDESANSTALT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; CRYOSTATS; LOW TEMPERATURE EFFECTS; MOLECULAR BEAM EPITAXY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SELF ASSEMBLY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM DOTS; SUPERFLUID HELIUM;

OPTICAL MICROSCOPES;

MICROELECTRONICS;

EID: 0037387611 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-002-1970-y Document Type: Conference Paper

Times cited : (7)

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