Bridge configuration of piezoresistive devices for scanning force microscopes

Sensors and Actuators, A: Physical

Volumn 70, Issue 1-2, 1998, Pages 88-91

  Jumpertz, R ^a   Schelten, J ^a   Ohlsson, O ^b   Saurenbach, F ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Nanosensors GmbH   (Germany)

^c Surface Imaging Systems GmbH   (Germany)

Author keywords

Bridge configuration; Magnetic force microscopy; Piezoresistivity; Scanning force microscopy

Indexed keywords

EID: 0043138979     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00118-6     Document Type: Article

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