-
1
-
-
0001641601
-
Atomic resolution on Si(1 1 1)-(7 × 7) by non-contact atomic force microscopy with a force sensor based upon a quartz tuning fork
-
Giessibl F J 2000 Atomic resolution on Si(1 1 1)-(7 × 7) by non-contact atomic force microscopy with a force sensor based upon a quartz tuning fork Appl. Phys. Lett. 76 1470-2
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 1470-1472
-
-
Giessibl, F.J.1
-
2
-
-
0034698297
-
Subatomic features on the silicon (1 1 1)-(7 × 7) surface observed by atomic force microscopy
-
Giessibl F J, Hembacher S, Bielefeldt H and Mannhart J 2000 Subatomic features on the silicon (1 1 1)-(7 × 7) surface observed by atomic force microscopy Science 289 422-5
-
(2000)
Science
, vol.289
, pp. 422-425
-
-
Giessibl, F.J.1
Hembacher, S.2
Bielefeldt, H.3
Mannhart, J.4
-
5
-
-
0031335957
-
A brief review of progress in quartz tuning fork resonators
-
New York: IEEE
-
Momosaki E 1997 A brief review of progress in quartz tuning fork resonators Proc. 1997 IEEE Int. Freq. Contr. Symp. (New York: IEEE) pp 552-65
-
(1997)
Proc. 1997 IEEE Int. Freq. Contr. Symp.
, pp. 552-565
-
-
Momosaki, E.1
-
6
-
-
0029634150
-
Piezoelectric tip-sample distance control for near field optical microscopes
-
Karrai K and Grober R D 1995 Piezoelectric tip-sample distance control for near field optical microscopes Appl. Phys. Lett. 66 1842-4
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1842-1844
-
-
Karrai, K.1
Grober, R.D.2
-
7
-
-
0000650299
-
Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
-
Edwards H, Taylor L, Duncan W and Melmed A J 1997 Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor J. Appl. Phys. 82 980-4
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 980-984
-
-
Edwards, H.1
Taylor, L.2
Duncan, W.3
Melmed, A.J.4
-
8
-
-
21944434990
-
High speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
-
Giessibl F J 1998 High speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork Appl. Phys. Lett. 73 3956-8
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3956-3958
-
-
Giessibl, F.J.1
-
9
-
-
0042220680
-
Tip-sample distance control for near field optical microscopes
-
Karrai K and Grober R D 1995 Tip-sample distance control for near field optical microscopes Proc. SPIE 2535 69-81
-
(1995)
Proc. SPIE
, vol.2535
, pp. 69-81
-
-
Karrai, K.1
Grober, R.D.2
-
10
-
-
0001611735
-
Noncontact scanning force microscopy based on a modified tuning fork sensor
-
Göttlich H, Stark R W, Pedarnig J D and Heckl W M 2000 Noncontact scanning force microscopy based on a modified tuning fork sensor Rev. Sci. Instrum. 71 3104-7
-
(2000)
Rev. Sci. Instrum.
, vol.71
, pp. 3104-3107
-
-
Göttlich, H.1
Stark, R.W.2
Pedarnig, J.D.3
Heckl, W.M.4
-
11
-
-
0000664807
-
Fundamental limits to force detection using quartz tuning forks
-
Grober R D, Acimovic J, Schuck J, Hessman D, Kindlemann P J, Hespanha J, Morse A S, Karrai K, Tiemann I and Manus S 2000 Fundamental limits to force detection using quartz tuning forks Rev. Sci. Instrum. 71 2776-80
-
(2000)
Rev. Sci. Instrum.
, vol.71
, pp. 2776-2780
-
-
Grober, R.D.1
Acimovic, J.2
Schuck, J.3
Hessman, D.4
Kindlemann, P.J.5
Hespanha, J.6
Morse, A.S.7
Karrai, K.8
Tiemann, I.9
Manus, S.10
-
12
-
-
0035839872
-
Quartz tuning forks as sensors for attractive mode force microscopy under ambient conditions
-
King G M, Lamb J S and Nunes G Jr 2001 Quartz tuning forks as sensors for attractive mode force microscopy under ambient conditions Appl. Phys. Lett. 79 1712-4
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1712-1714
-
-
King, G.M.1
Lamb, J.S.2
Nunes Jr., G.3
-
14
-
-
0037387611
-
Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures
-
Danzebrink H-U, Kazantsev D V, Dal Savio C, Pierz K and Güttler B 2003 Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures Appl. Phys. A 76 889-92
-
(2003)
Appl. Phys. A
, vol.76
, pp. 889-892
-
-
Danzebrink, H.-U.1
Kazantsev, D.V.2
Dal Savio, C.3
Pierz, K.4
Güttler, B.5
-
15
-
-
0000400209
-
Physical interpretation of frequency-modulation atomic force microscopy
-
Giessibl F J and Bielefeldt H 2000 Physical interpretation of frequency-modulation atomic force microscopy Phys. Rev. B 61 9968-71
-
(2000)
Phys. Rev. B
, vol.61
, pp. 9968-9971
-
-
Giessibl, F.J.1
Bielefeldt, H.2
-
16
-
-
0035503888
-
Attractive-mode force microscope for investigations of biomolecules under ambient conditions
-
King G M and Nunes G Jr 2001 Attractive-mode force microscope for investigations of biomolecules under ambient conditions Rev. Sci. Instrum. 72 4261-5
-
(2001)
Rev. Sci. Instrum.
, vol.72
, pp. 4261-4265
-
-
King, G.M.1
Nunes Jr., G.2
|