Soft X-ray spectroscopy of diluted magnetic semiconductor Ga 1-xMxN (M = Cr, Mn)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 707-710

  Takeuchi, T ^a,b   Harada, Y ^b   Tokushima, T ^b   Takata, Y ^b   Chainani, A ^b   Kim, J J ^c   Chen, P P ^d   Makino, H ^d   Hanada, T ^d   Yao, T ^c,d   Yamamoto, T ^e   Tsukamoto, T ^a   Kobayashi, K ^f   Shin, S ^b,g  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b RIKEN   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

^e KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

^f JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^g UNIVERSITY OF TOKYO   (Japan)

Author keywords

Density functional theory; Diluted magnetic semiconductor; Soft X ray emission; X ray absorption

Indexed keywords

CHROMIUM; ELECTRONIC STRUCTURE; FERROMAGNETISM; SEMICONDUCTING GALLIUM; SEMICONDUCTOR DOPING; THERMAL EFFECTS; X RAY SPECTROSCOPY;

DENSITY FUNCTIONAL THEORY; DILUTED MAGNETIC SEMICONDUCTORS; SOFT X-RAY EMISSIONS; X-RAY ABSORPTION;

MAGNETIC SEMICONDUCTORS;

EID: 20244376168     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.130     Document Type: Conference Paper

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