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Volumn 54, Issue 24, 1996, Pages R17335-R17338

Electronic structure of GaN measured using soft-x-ray emission and absorption

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000666402     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.R17335     Document Type: Article
Times cited : (68)

References (25)
  • 2
    • 0000815007 scopus 로고
    • S. Strite and H. Morkoç, J. Vac. Sci. Technol. B 10, 1237 (1992)
    • (1992) , vol.10 , pp. 1237
    • Strite, S.1    Morkoç, H.2
  • 4
    • 24844436062 scopus 로고
    • Yong-Nian Xu and W. Y. Ching, Phys. Rev. B 48, 4335 (1993)
    • (1993) Phys. Rev. B , vol.48 , pp. 4335
    • Ching, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.