Growth and characterization of Ga1-xCrxN with high Cr content grown on ZnO templates

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2869-2873

  Kim, J J ^a   Makino, H ^a   Chen, P P ^a   Suzuki, T ^a   Oh, D C ^a   Ko, H J ^c   Chang, J H ^d   Hanada, T ^a   Yao, T ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c Korea Photonics Technology Institute (KOPTI)   (South Korea)

^d Korea Maritime University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CR CONTENT; EPILAYER FILMS; HIGH CR CONTENT; HIGH RESOLUTION X RAY DIFFRACTION; PARAMAGNETIC COMPONENTS; ZNO;

NITRIDES; PARAMAGNETISM; X RAY DIFFRACTION; ZINC OXIDE;

CHROMIUM;

EID: 84875117236     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303281     Document Type: Conference Paper

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