Design of a flat field spectrometer for soft X-ray emission spectroscopy

Surface Review and Letters

Volumn 9, Issue 1, 2002, Pages 503-508

  Tokushima, T ^a,b   Harada, Y ^a   Watanabe, M ^a   Takata, Y ^a   Ishiguro, E ^c   Hiraya, A ^b   Shin, S ^a,d  

^a RIKEN/SPring 8 ^*  (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c UNIVERSITY OF THE RYUKYUS   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONFERENCE PAPER; IMAGE QUALITY; MATHEMATICAL ANALYSIS; OPTICAL RESOLUTION; RADIATION BEAM; SOFT X RAY SPECTROSCOPY; SPECTROMETRY; SPECTROSCOPY;

EID: 0036462897     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X02002567     Document Type: Conference Paper

References (12)