Investigation on surface of p-GaN

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

Volumn 24, Issue 12, 2003, Pages 1280-1284

  Xue, Song ^a   Han, Yanjun ^a   Guo, Wenping ^a   Sun, Changzheng ^a   Hao, Zhibiao ^a   Luo, Yi ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

AES; P GaN; Surface treatment; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; GALLIUM NITRIDE; OHMIC CONTACTS; PHYSICAL PROPERTIES; SURFACE PROPERTIES; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

NICKEL GOLD CONTACTS;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 1942541477     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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