Rutherford backscattering and channeling, double crystal X-ray diffraction and photoluminescence of GaN

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

Volumn 21, Issue 5, 2000, Pages 437-440

  Yao, Dongmin ^a   Xin, Yong ^a   Wang, Li ^a   Li, Shuti ^a   Xiong, Chuanbing ^a   Peng, Xuexin ^a   Liu, Nianhua ^a   Jiang, Fengyi ^a  

^a NANCHANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

NITRIDES; PHOTOLUMINESCENCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION;

DOUBLE CRYSTAL X RAY DIFFRACTION; SEMICONDUCTING GALLIUM NITRIDE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0034184617     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)