XPS and AES investigation of GaN films grown by MBE

Wuli Xuebao/Acta Physica Sinica

Volumn 50, Issue 12, 2001, Pages 2432-2433

  Yuan, Jin She ^a,b   Chen, Guang De ^a   Qi, Ming ^c   Li, Ai Zhen ^c   Xu, Zhuo ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b XI'AN UNIVERSITY OF TECHNOLOGY   (China)

^c SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

AES; GaN film; Surface analysis; XPS

Indexed keywords

EID: 0042338383     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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