Structural variation of the interface-engineered layers in YBa2Cu3O7-δ thin films

Physica C: Superconductivity and its Applications

Volumn 366, Issue 1, 2001, Pages 51-56

  Wu, Y ^a   Ishimaru, Y ^a   Tanabe, K ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

Microstructure; Plasma treatment; Transmission electron microscopy; YBa2Cu3O7 multilayers

Indexed keywords

CRYSTAL STRUCTURE; INTERFACES (MATERIALS); MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

BARRIER LAYERS;

THIN FILMS;

EID: 0035892565     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)00785-7     Document Type: Article

References (10)