Image-based compensation of dynamic effects in scanning tunnelling microscopes

Nanotechnology

Volumn 16, Issue 6, 2005, Pages 809-818

  Clayton, G M ^a   Devasia, S ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DIELECTRIC DEVICES; DYNAMIC LOADS; ELECTRIC DISTORTION; NANOTECHNOLOGY; NATURAL FREQUENCIES; RESONANCE;

DYNAMIC EFFECTS; POST-PROCESSINGS; RESONANCE FREQUENCIES; TEMPORAL RESOLUTION;

SCANNING TUNNELING MICROSCOPY;

EID: 18744392243     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/6/032     Document Type: Article

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