Automatic lateral calibration of tunneling microscope scanners

Review of Scientific Instruments

Volumn 69, Issue 9, 1998, Pages 3268-3276

  Lapshin, Rostislav V ^a  

^a Zelenograd Research Institute of Physical Problems   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041718850     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149091     Document Type: Article

References (19)

1. H. Kawakatsu and H. Kougami, J. Vac. Sci Technol. B 14, 11 (1996).
2. D. W. Pohl, IBM J. Res. Dev. 30, 417 (1986).
3. V. Yu. Yurov and A. N. Klimov, Rev. Sci. Instrum. 65, 1551 (1994).
4. J. F. Jørgensen, L. L. Madsen, J. Garnaes, and K. Carneiro, J. Vac. Sci. Technol. B 12, 1698 (1994).
5. R. V. Lapshin, Rev. Sci. Instrum. 66, 4718 (1995).
6. S. Vieira, IBM J. Res. Dev. 30, 553 (1986);
7. E. P. Stoll, Ultramicroscopy 42-44, 1585 (1992).
8. S. Carrara, P. Facci, and C. Nicolini, Rev. Sci. Instrum. 65, 2860 (1994).
9. E. J. Snyder, E. A. Eklund, and R. S. Williams, Surf. Sci. Lett. 239, L487 (1990).
10. G. S. Sidhu and R. T. Boute, IEEE Trans. Comput. C-21, 1206 (1972).
11. H. Freeman, IRE Trans. Electron. Comput. EC-10, 260 (1961).
12. A. Rosenfeld and A. C. Kak, Digital Picture Processing (Academic, New York, 1976).
13. Microscope Solver P4 from NT-MDTC Co.
14. D. Tománek, S. G. Louie, H. J. Mamin, D. W. Abraham, R. E. Thomson, E. Ganz, and J. Clarke, Phys. Rev. B 35, 7790 (1987).
15. P. Trucano and R. Chen, Nature 258, 136 (1975).
16. The STM of the Physical Chemistry Institute of Russian Academy of Sciences.
17. Sample was made by S. A. Gavrilov (Zelenograd Physical Problems Institute).
18. A. V. Emelyanov and V. V. Egorkin, Journal of Surface: Physics, Chemistry, Mechanics (in Russian) 1, 94 (1988);
19. S. D. Dubrovenskiy, A. V. Emelyanov, A. V. Zimin, V. N. Inkin, A. A. Malkov, A. A. Malygin, and S. M. Portnov, J. Appl. Chem. (in Russian) 65, 2259 (1992).