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Volumn 15, Issue 5, 2005, Pages 771-780

Freely suspended layer-by-layer nanomembranes: Testing micromechanical properties

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITE MICROMECHANICS; DEFORMATION; ELASTIC MODULI; LANGMUIR BLODGETT FILMS; MECHANICAL PROPERTIES; MICROSENSORS; MULTILAYERS; NANOSTRUCTURED MATERIALS; POLYELECTROLYTES; RESONANCE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 18744383387     PISSN: 1616301X     EISSN: None     Source Type: Journal    
DOI: 10.1002/adfm.200400149     Document Type: Article
Times cited : (181)

References (69)
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    • (1959) Structure and Properties of Thin Solid Films , pp. 183
    • Beams, J.W.1
  • 66
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    • ACS Symposium Series, American Chemical Society, Washington, DC
    • c) Scanning Probe Microscopy of Polymers, ACS Symposium Series, Vol. 694, American Chemical Society, Washington, DC 1998.
    • (1998) Scanning Probe Microscopy of Polymers , vol.694


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.