On n-detection test sequences for synchronous sequential circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 336-342

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; SEQUENTIAL CIRCUITS;

NONFEEDBACK BRIDGING FAULT;

INTEGRATED CIRCUIT TESTING;

EID: 0030685579     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)