Novel algorithm to extract two-node bridges

Proceedings - Design Automation Conference

Volumn , Issue , 2000, Pages 790-793

  Zachariah, Sujit T ^a   Chakravarty, Sreejit ^a   Roth, Carl D ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTATIONAL METHODS; COMPUTER SIMULATION; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; PROBABILITY DISTRIBUTIONS; SET THEORY;

DEFECT BASED TESTING; TWO NODE BRIDGES;

INTEGRATED CIRCUIT TESTING;

EID: 0033716235     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)