Scanning force microscopy studies of GaAs films grown on offcut Ge substrates

Journal of Electronic Materials

Volumn 27, Issue 9, 1998, Pages 1010-1016

  Xu, Q ^a   Hsu, J W P ^a   Ting, S M ^b   Fitzgerald, E A ^b   Sieg, R M ^c   Ringel, S A ^c  

^a University of Virginia   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c Ohio State University   (United States)

Author keywords

Antiphase boundary (APB); GaAs on Ge; Molecular beam epitaxy (MBE); Scanning force microscopy (SFM)

Indexed keywords

EID: 0004934136     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-998-0154-8     Document Type: Article

References (18)

1. S. Strite, M.S. Ünlü, K. Adomi, G.B. Gao, A. Agarwal, A. Rockett, H. Morkoç, D. Li, Y. Nakamura and N. Otsuka, J. Vac. Sci Technol. B 8, 1131 (1990).
2. N. Chand, J. Klem and H. Morkoç, Appl. Phys. Lett. 48, 484 (1986).
3. P.A. Iles, Y.C.M. Yeh, F.H. Ho, C.L. Chu and C. Cheng, IEEE Electron Device Lett. 11, 140 (1990).
4. S.M. Ting, E.A. Fitzgerald, R.M. Sieg and S.A. Ringel, J. Electron. Mater. 27, 451 (1998).
5. H. Kroemer, J. Cryst. Growth 81, 193 (1987).
6. J.C. Chen, M.L. Ristow, J.I. Cubbage and J.G. Werthen, J. Electron. Mater. 21, (3) 347 (1992).
7. R.M. Sieg, S.A. Ringel, S.M. Ting, E.A. Fitzgerald and R. Sacks, J. Electron. Mater. 27, 900 (1998).
8. AutoProbe CP, manufactured by Park Scientific Instrument of Sunnyvale, CA.
9. Q. Xu, J.W. P. Hsu, E.A. Fitzgerald, J.M. Kuo, Y.H. Xie and P.J. Silverman, J. Electron. Mater. 25, (6) 1009 (1996).
10. C. Orme, M.D. Johnson, J.L. Sudijono, K.T. Leung and B.G. Orr, Appl. Phys. Lett. 64, 860 (1994).
11. P. Franzosi, L. Lazzarini, G. Salviati, M. Scaffardi and G. Timo, Inst. Phys. Conf: Ser. 117, Section 7.
12. C. Bocchi, B. Bollani, P. Franzosi, L. Lazzarini, D. Passoni and G. Timo, Inst. Phys. Conf. Ser. 117, Section 9.
13. G. Timo, C. Flores, B. Bollani, D. Passoni, C. Bocchi, P. Franzosi, L. Lazzarini and G. Salviati, J. Cryst. Growth 125, 440 (1992).
14. P. Kightley, P.J. Goodhew, R.R. Bradley and P.D. Augustus, J. Cryst. Growth 112, 359 (1991).
15. E.A. Fitzgerald, Y.H. Xie, D. Monroe, P.J. Silverman, J.M. Kuo, A.R. Kortan, F.A. Thiel and B.E. Weir, J. Vac. Sci. Technol. B 10, 1807 (1992).
16. R.C. Gonzalez and R.E. Woods, Digital Image Processing (New York: Addison Wesley, 1992), Chap. 9.
17. E.A. Fitzgerald, J.M. Kuo, Y.H. Xie and P.J. Silverman, Appl. Phys. Lett. 64, 733 (1994).
18. R.D. Bringans, D.K. Biegelsen and L.E. Swartz, Phys. Rev. B 44, 3054 (1991).