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Volumn , Issue , 2004, Pages 429-432

Improving the ambipolar behavior of schottky barrier carbon nanotube field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CAPACITANCE; CARBON NANOTUBES; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; FABRICATION; SCHOTTKY BARRIER DIODES;

EID: 17644388153     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (19)

References (15)
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  • 6
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    • Drain voltage scaling in carbon nanotube transistors
    • M. Radosavljevic, S. Heinze, J. Tersoff, and P. Avouris, "Drain Voltage Scaling in Carbon Nanotube Transistors," Appl.Phys.Lett., vol. 83, no. 12, pp. 2435-2437, 2003.
    • (2003) Appl. Phys. Lett. , vol.83 , Issue.12 , pp. 2435-2437
    • Radosavljevic, M.1    Heinze, S.2    Tersoff, J.3    Avouris, P.4
  • 7
    • 0347763790 scopus 로고    scopus 로고
    • Electrostatic engineering of nanotube transistors for improved performance
    • S. Heinze, J. Tersoff, and P. Avouris, "Electrostatic Engineering of Nanotube Transistors for Improved Performance," Appl.Phys.Lett., vol. 83, no. 24, pp. 5038-5040, 2003.
    • (2003) Appl. Phys. Lett. , vol.83 , Issue.24 , pp. 5038-5040
    • Heinze, S.1    Tersoff, J.2    Avouris, P.3
  • 8
    • 0842343398 scopus 로고    scopus 로고
    • Unexpected scaling of the performance of carbon nanotube schottky-barrier transistors
    • S. Heinze, M. Radosavljevic, J. Tersoff, and P. Avouris, "Unexpected Scaling of the Performance of Carbon Nanotube Schottky-Barrier Transistors," Physical Review B, vol. 68, no. 23, pp. 235418-5, 2003.
    • (2003) Physical Review B , vol.68 , Issue.23 , pp. 235418-235425
    • Heinze, S.1    Radosavljevic, M.2    Tersoff, J.3    Avouris, P.4
  • 10
    • 0041445527 scopus 로고    scopus 로고
    • Novel length scales in nanotube devices
    • F. Léonard and J. Tersoff, "Novel Length Scales in Nanotube Devices," Physical Review Letters, vol. 83, no. 24, pp. 5174-5177, 1999.
    • (1999) Physical Review Letters , vol.83 , Issue.24 , pp. 5174-5177
    • Léonard, F.1    Tersoff, J.2
  • 11
    • 0037104354 scopus 로고    scopus 로고
    • Transport through the interface between a semiconducting carbon nanotube and a metal electrode
    • T. Nakanishi, A. Bachtold, and C. Dekker, "Transport Through the Interface Between a Semiconducting Carbon Nanotube and a Metal Electrode," Physical Review B, vol. 66, no. 7, pp. 073307-4, 2002.
    • (2002) Physical Review B , vol.66 , Issue.7 , pp. 73307-73314
    • Nakanishi, T.1    Bachtold, A.2    Dekker, C.3
  • 12
    • 11744337476 scopus 로고    scopus 로고
    • Universal density of states for carbon nanotubes
    • J. W. Mintmire and C. T. White, "Universal Density of States for Carbon Nanotubes," Physical Review Letters, vol. 81, no. 12, pp. 2506-2509, 1998.
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    • Mintmire, J.W.1    White, C.T.2
  • 13
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    • A finite element simulator for three-dimensional analysis of interconnect structures
    • R. Sabelka and S. Selberherr, "A Finite Element Simulator for Three-Dimensional Analysis of Interconnect Structures," Microelectronics Journal, vol. 32, no. 2, pp. 163-171, 2001.
    • (2001) Microelectronics Journal , vol.32 , Issue.2 , pp. 163-171
    • Sabelka, R.1    Selberherr, S.2
  • 14
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.