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Volumn 68, Issue 23, 2003, Pages

Unexpected scaling of the performance of carbon nanotube Schottky-barrier transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARBON;

EID: 0842343398     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.235418     Document Type: Article
Times cited : (122)

References (24)
  • 11
    • 85039008704 scopus 로고    scopus 로고
    • They were used without further treatment and dispersed in dichloroethane by a short exposure to ultrasound
    • They were used without further treatment and dispersed in dichloroethane by a short exposure to ultrasound.
  • 17
    • 0003409205 scopus 로고
    • More accurate methods are available; see, Cambridge University Press, Cambridge, However, WKB is sufficient for our application. The transmission factor for tunneling is very low in the turn-on regime, so a careful treatment of the non-equilibrium charge is unnecessary. The current varies over orders of magnitude, so high precision is not essential, and absolute accuracy is limited by the absence of detailed structural information regarding the metal-nanotube contact
    • More accurate methods are available; see S. Datta, Electronic Transport in Mesoscopic Systems (Cambridge University Press, Cambridge, 1995). However, WKB is sufficient for our application. The transmission factor for tunneling is very low in the turn-on regime, so a careful treatment of the non-equilibrium charge is unnecessary. The current varies over orders of magnitude, so high precision is not essential, and absolute accuracy is limited by the absence of detailed structural information regarding the metal-nanotube contact.
    • (1995) Electronic Transport in Mesoscopic Systems
    • Datta, S.1
  • 19
    • 85039017164 scopus 로고    scopus 로고
    • The main effect of charge on the NT (which we neglect) is to alter the potential within the NT channel. Source and drain SB’s are relatively unaffected in the energy range of significant tunneling current. The current is limited by the channel only when there is negligible charge in the channel. As a result, the approximation gives a good description of the current [except perhaps in the fully “On” regime (Ref. 22)], and so does not affect our conclusions
    • The main effect of charge on the NT (which we neglect) is to alter the potential within the NT channel. Source and drain SB’s are relatively unaffected in the energy range of significant tunneling current. The current is limited by the channel only when there is negligible charge in the channel. As a result, the approximation gives a good description of the current [except perhaps in the fully “On” regime (Ref. 22)], and so does not affect our conclusions.
  • 21
    • 85039025154 scopus 로고    scopus 로고
    • We find numerically that, in the long-channel limit (LNT ≫ tox), I and S are nearly independent of Vd for Vd ≳ 0.1 V, because current in the turn-on regime is then limited by the source and not the drain. Then we can conveniently describe ideal saturation by taking the limit of a vanishing drain barrier (Vd = Vg), where all carriers injected at the source can be collected at the drain. However, we note that in some cases our experimental devices exhibit apparent short-channel effects (Ref. 11). We have therefore verified numerically that, while the short-channel S (at fixed Vd) is somewhat increased compared to the long-channel limit at any given tox, the observed trend of S vs tox persists. Thus our experimental findings can be adequately modeled using long-channel devices at ideal saturation and vanishing drain barrier
    • ox persists. Thus our experimental findings can be adequately modeled using long-channel devices at ideal saturation and vanishing drain barrier.
  • 22
    • 85038994054 scopus 로고    scopus 로고
    • This interpretation is supported by transmission electron microscopy images of the device cross section, which show that our source/drain contacts are not nearly as sharp and perpendicular to the substrate as assumed in the simulation
    • This interpretation is supported by transmission electron microscopy images of the device cross section, which show that our source/drain contacts are not nearly as sharp and perpendicular to the substrate as assumed in the simulation.
  • 24
    • 85039010237 scopus 로고    scopus 로고
    • In the regime of full turn-on, if the Schottky barriers become sufficiently transparent, other factors can come into play in determining the current. Then effects that we neglect can become significant, including the (non-equilibrium) charge in the NT channel. Thus the gate-channel capacitance (and hence the dielectric constant) affects the maximum On-current, cond-mat/0306199, IEEE Trans. Electron Devices (to be published)
    • In the regime of full turn-on, if the Schottky barriers become sufficiently transparent, other factors can come into play in determining the current. Then effects that we neglect can become significant, including the (non-equilibrium) charge in the NT channel. Thus the gate-channel capacitance (and hence the dielectric constant) affects the maximum On-current, see J. Guo, S. Datta, and M. Lundstrom, cond-mat/0306199, IEEE Trans. Electron Devices (to be published).
    • Guo, J.1    Datta, S.2    Lundstrom, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.