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Volumn 97, Issue 7, 2005, Pages

Engineering of boron-induced dislocation loops for efficient room-temperature silicon light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

BORON; DIFFUSION; ENERGY GAP; FABRICATION; ION IMPLANTATION; LIGHT EMISSION; LIGHT EMITTING DIODES; RAPID THERMAL ANNEALING; SEMICONDUCTING SILICON; TRANSMISSION ELECTRON MICROSCOPY; ULSI CIRCUITS; VECTORS;

EID: 17444373891     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866492     Document Type: Article
Times cited : (30)

References (25)
  • 25
    • 84952270781 scopus 로고
    • J.Narayan and T. Y.Tan (North-Holland, Amsterdam
    • T. Y. Tan, in Defects in Semiconductors, edited by, J. Narayan, and, T. Y. Tan, (North-Holland, Amsterdam, 1981), pp. 163-172.
    • (1981) Defects in Semiconductors, Edited by , pp. 163-172
    • Tan, T.Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.