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Volumn 82, Issue 2, 1997, Pages 601-606

Transmission electron microscopy on {113} rodlike defects and {111} dislocation loops in silicon-implanted silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0039127945     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365587     Document Type: Article
Times cited : (27)

References (18)
  • 17
    • 0023020368 scopus 로고
    • Materials Issues in Silicon Integrated Circuit Processing
    • edited by M. Strathman, J. Stimmel, and M. Wittmer (Materials Research Society, Pittsburgh)
    • K. S. Jones and S. Prussin, Materials Issues in Silicon Integrated Circuit Processing, Proceedings of the Materials Research Society, edited by M. Strathman, J. Stimmel, and M. Wittmer (Materials Research Society, Pittsburgh, 1986), Vol. 71.
    • (1986) Proceedings of the Materials Research Society , vol.71
    • Jones, K.S.1    Prussin, S.2
  • 18
    • 3843137095 scopus 로고
    • Statistics: Text Books and Monographs
    • Marcel Dekker, New York
    • J. K. Patel and C. B. Read, "Statistics: Text Books and Monographs," in Handbook of the Normal Distribution (Marcel Dekker, New York, 1982), Vol. 40, pp. 19-40.
    • (1982) Handbook of the Normal Distribution , vol.40 , pp. 19-40
    • Patel, J.K.1    Read, C.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.