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Volumn 455-456, Issue , 2004, Pages 272-277

Infrared spectroscopic ellipsometry study of molecular orientation induced anisotropy in polymer substrates

Author keywords

Anisotropy; Infrared spectroscopic ellipsometry; Molecular bond absorptions

Indexed keywords

ANISOTROPY; CHEMICAL BONDS; ELLIPSOMETRY; INFRARED RADIATION; MOLECULAR ORIENTATION; OPTICAL PROPERTIES; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

EID: 17144459589     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.216     Document Type: Conference Paper
Times cited : (15)

References (23)
  • 16
    • 0033645688 scopus 로고    scopus 로고
    • Optical Diagnostic Methods for Materials II
    • L.M. Hanssen (Ed.), San Diego, USA, 30th July, 2000
    • T.E. Tiwald, M. Schubert, in: L.M. Hanssen (Ed.), Optical Diagnostic Methods for Materials II, San Diego, USA, 30th July, 2000, Proceedings of SPIE, vol. 4103, 2000, p. 19.
    • (2000) Proceedings of SPIE , vol.4103 , pp. 19
    • Tiwald, T.E.1    Schubert, M.2
  • 20
    • 2142647206 scopus 로고    scopus 로고
    • J.A. Woollam Co., Inc., Lincoln, NE, USA
    • WVASE32 software, J.A. Woollam Co., Inc., Lincoln, NE, USA.
    • WVASE32 Software
  • 21
    • 84923914618 scopus 로고    scopus 로고
    • J.A. Woollam Co., Inc., Lincoln, NE, USA
    • IR-VASE system, J.A. Woollam Co., Inc., Lincoln, NE, USA.
    • IR-VASE System


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.