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Volumn 374, Issue 4, 2002, Pages 665-671
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Infrared ellipsometric view on monolayers: Towards resolving structural details
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Author keywords
Anisotropy; Infrared ellipsometry; Molecular orientation; Monolayer; Surface analysis; Synchrotron radiation
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Indexed keywords
ANISOTROPY;
ELLIPSOMETRY;
MOLECULAR ORIENTATION;
SYNCHROTRON RADIATION;
INFRARED BEAMLINE;
MONOLAYERS;
ANISOTROPY;
CONFERENCE PAPER;
ELLIPSOMETRY;
INFRARED SPECTROMETRY;
MOLECULAR BIOLOGY;
RADIATION;
SURFACE PROPERTY;
SYNCHROTRON;
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EID: 2242436244
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-002-1476-7 Document Type: Conference Paper |
Times cited : (4)
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References (20)
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