The Use of Infrared Spectroscopic Ellipsometry for the Thickness Determination and Molecular Characterization of Thin Films on Aluminum

Journal of the Electrochemical Society

Volumn 148, Issue 2, 2001, Pages

  Schram, T ^a   Terryn, H ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002428736     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1341244     Document Type: Article

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