Use of XPS for the study of cerium-vanadium (electrochromic) mixed oxides

Surface and Interface Analysis

Volumn 31, Issue 4, 2001, Pages 255-264

  Salvi, A M ^a   Decker, F ^b   Varsano, F ^b   Speranza, G ^c  

^a UNIVERSITY OF BASILICATA   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

^c ITC IRST   (Italy)

Author keywords

Ce V mixed oxide; Electrochromism; XAES; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CERIUM; ELECTROCHROMIC DEVICES; IONS; SPUTTER DEPOSITION; THIN FILMS; VANADIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

MIXED OXIDES;

OXIDES;

EID: 0035303864     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.986     Document Type: Article

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