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Volumn , Issue , 2004, Pages 32-37

Microarchitectural techniques for power gating of execution units

Author keywords

Execution units; Low power; Microarchitecture; Power gating

Indexed keywords

CACHE MEMORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; LOGIC CIRCUITS; MATHEMATICAL MODELS; STATIC RANDOM ACCESS STORAGE; THRESHOLD VOLTAGE; TRANSISTORS;

EID: 16244409255     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1013235.1013249     Document Type: Conference Paper
Times cited : (239)

References (16)
  • 1
    • 0032592096 scopus 로고    scopus 로고
    • Design challenges of technology scaling
    • BORKAR, S. Design Challenges of Technology Scaling. IEEE Micro 19, 4 (1999).
    • (1999) IEEE Micro , vol.19 , Issue.4
    • Borkar, S.1
  • 2
    • 0036949550 scopus 로고    scopus 로고
    • Standby power management for a 0.18um microprocessor
    • CLARK, L., DEMMONS, S., DEUTSCHER, N., AND RICCI, F. Standby Power Management for a 0.18um Microprocessor. In ISLPED (2002).
    • (2002) ISLPED
    • Clark, L.1    Demmons, S.2    Deutscher, N.3    Ricci, F.4
  • 4
    • 84962299846 scopus 로고    scopus 로고
    • Evaluating run-time techniques for leakage power reduction
    • DUARTE, D., TSAI, Y. F., VIJAYKRISHNAN, N., AND IRWIN, M. J. Evaluating Run-Time Techniques for Leakage Power Reduction. In ASPDAC (2002).
    • (2002) ASPDAC
    • Duarte, D.1    Tsai, Y.F.2    Vijaykrishnan, N.3    Irwin, M.J.4
  • 5
    • 0036294454 scopus 로고    scopus 로고
    • Drowsy caches: Simple techniques for reducing leakage power
    • FLAUTNER, K., KIM, N. S., MARTIN, S., BLAAUW, D., AND MUDGE, T. Drowsy Caches: Simple Techniques for Reducing Leakage Power. In ISCA (2002).
    • (2002) ISCA
    • Flautner, K.1    Kim, N.S.2    Martin, S.3    Blaauw, D.4    Mudge, T.5
  • 6
    • 0036948939 scopus 로고    scopus 로고
    • Circuit-level techniques to control gate leakage for sub-100nm CMOS
    • HAMZAOGLU, F., AND STAN, M. R. Circuit-Level Techniques to Control Gate Leakage for sub-100nm CMOS. In ISLPED (2002).
    • (2002) ISLPED
    • Hamzaoglu, F.1    Stan, M.R.2
  • 7
    • 0036292678 scopus 로고    scopus 로고
    • Dynamic fine-grain leakage reduction using leakage-biased bitlines
    • HEO, S., BARR, K., HAMPTON, M., AND ASANOVIC, K. Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines. In ISCA (137-147, 2002).
    • (2002) ISCA , pp. 137-147
    • Heo, S.1    Barr, K.2    Hampton, M.3    Asanovic, K.4
  • 8
    • 0029700388 scopus 로고    scopus 로고
    • Representative traces for processor models with infinite cache
    • IYENGAR, V., TREVILLYAN, L. H., AND BOSE, P. Representative Traces for Processor Models with Infinite Cache. In HPCA (1996).
    • (1996) HPCA
    • Iyengar, V.1    Trevillyan, L.H.2    Bose, P.3
  • 10
  • 11
    • 0034856732 scopus 로고    scopus 로고
    • Cache decay: Exploiting generational behavior to reduce cache leakage power
    • KAXIRAS, S., HU, Z., AND MARTONOSI, M. Cache Decay: Exploiting Generational Behavior to Reduce Cache Leakage Power. In ISCA (2001).
    • (2001) ISCA
    • Kaxiras, S.1    Hu, Z.2    Martonosi, M.3
  • 12
    • 84994353124 scopus 로고    scopus 로고
    • Validation of turandot, a fast processor model for microarchitecture exploration
    • MOUDGILL, M., BOSE, P., AND MORENO, J. H. Validation of Turandot, a Fast Processor Model for Microarchitecture Exploration. In IPCCC (1999).
    • (1999) IPCCC
    • Moudgill, M.1    Bose, P.2    Moreno, J.H.3
  • 13
    • 0032683935 scopus 로고    scopus 로고
    • Environment for PowerPC microarchitecture exploration
    • MOUDGILL, M., WELLMAN, J. D., AND MORENO, J. H. Environment for PowerPC Microarchitecture Exploration. IEEE Micro 19, 3 (1999).
    • (1999) IEEE Micro , vol.19 , Issue.3
    • Moudgill, M.1    Wellman, J.D.2    Moreno, J.H.3
  • 14
    • 0033672408 scopus 로고    scopus 로고
    • Gated-Vdd: A circuit technique to reduce leakage in deep-submicron cache memories
    • POWELL, M., YANG, S., FALSAFI, B., ROY, K., AND VIJAYKUMAR, T. Gated-Vdd: A Circuit Technique to Reduce Leakage in Deep-Submicron Cache Memories. In ISLPED (2000).
    • (2000) ISLPED
    • Powell, M.1    Yang, S.2    Falsafi, B.3    Roy, K.4    Vijaykumar, T.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.