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Volumn 22, Issue 10, 2003, Pages 1399-1408

An implicit path-delay fault diagnosis methodology

Author keywords

Delay testing; Diagnosis; Path delay faults (PDFs)

Indexed keywords

DATA STRUCTURES; DECISION TABLES; DELAY CIRCUITS; DIGITAL INTEGRATED CIRCUITS; FAILURE ANALYSIS; MATHEMATICAL MODELS; VECTORS; WAVEFORM ANALYSIS;

EID: 0142054803     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2003.818132     Document Type: Article
Times cited : (19)

References (17)
  • 1
    • 0029271036 scopus 로고
    • Test generation for path delay faults using binary decision diagrams
    • Mar.
    • D. Bhattacharya, P. Agrawal and V. D. Agrawal, "Test generation for path delay faults using binary decision diagrams," IEEE Trans. Computer-Aided Design, vol. 14, pp. 434-447, Mar. 1995.
    • (1995) IEEE Trans. Computer-Aided Design , vol.14 , pp. 434-447
    • Bhattacharya, D.1    Agrawal, P.2    Agrawal, V.D.3
  • 2
    • 0000327337 scopus 로고    scopus 로고
    • Generation of high quality tests for robustly untestable path delay faults
    • Dec.
    • K. T. Cheng, A. Krstic, and H. C. Chen, "Generation of high quality tests for robustly untestable path delay faults," IEEE Trans. Computers, vol. 45, pp. 1379-1392, Dec. 1996.
    • (1996) IEEE Trans. Computers , vol.45 , pp. 1379-1392
    • Cheng, K.T.1    Krstic, A.2    Chen, H.C.3
  • 3
    • 0030214852 scopus 로고    scopus 로고
    • Classification and identification of nonrobust untestable path delay faults
    • Aug.
    • K. T. Cheng and H. C. Chen, "Classification and identification of nonrobust untestable path delay faults," IEEE Trans. Computer-Aided Design, vol. 15, pp. 845-853, Aug. 1996.
    • (1996) IEEE Trans. Computer-Aided Design , vol.15 , pp. 845-853
    • Cheng, K.T.1    Chen, H.C.2
  • 5
    • 0026839944 scopus 로고
    • Synthesis of robust delay-fault-testable circuits: Practice
    • Mar.
    • S. Devadas and K. Keutzer, "Synthesis of robust delay-fault-testable circuits: Practice," IEEE Trans. Computer-Aided Design, vol. 11, pp. 277-300, Mar. 1992.
    • (1992) IEEE Trans. Computer-Aided Design , vol.11 , pp. 277-300
    • Devadas, S.1    Keutzer, K.2
  • 6
    • 0007717961 scopus 로고
    • Validatable nonrobust delay-fault circuits via logic synthesis
    • Dec.
    • ____, "Validatable nonrobust delay-fault circuits via logic synthesis," IEEE Trans. Computer-Aided Design, vol. 11, pp. 1559-1573, Dec. 1992.
    • (1992) IEEE Trans. Computer-Aided Design , vol.11 , pp. 1559-1573
    • Devadas, S.1    Keutzer, K.2
  • 7
    • 0029318778 scopus 로고
    • An advanced diagnostic method for delay faults in combinational faulty circuits
    • P. Girard, C. Landrault, and S. Pravossoudovitch, "An advanced diagnostic method for delay faults in combinational faulty circuits," J. Electron. Testing, vol. 6, no. 3, pp. 277-293, 1995.
    • (1995) J. Electron. Testing , vol.6 , Issue.3 , pp. 277-293
    • Girard, P.1    Landrault, C.2    Pravossoudovitch, S.3
  • 8
    • 0035483769 scopus 로고    scopus 로고
    • An adaptive path selection method for delay testing
    • Oct.
    • W.-B. Jone, W.-S. Yeh, C. Yeh, and S. R. Das, "An adaptive path selection method for delay testing," IEEE Trans. Instrum. Meas., vol. 50, pp. 1109-1118, Oct. 2001.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , pp. 1109-1118
    • Jone, W.-B.1    Yeh, W.-S.2    Yeh, C.3    Das, S.R.4
  • 9
    • 0029254208 scopus 로고
    • Synthesis of delay-verifiable combinational circuits
    • Feb.
    • W. Ke and P. R. Menon, "Synthesis of delay-verifiable combinational circuits," IEEE Trans. Comput., vol. 4, pp. 213-222, Feb. 1995.
    • (1995) IEEE Trans. Comput. , vol.44 , pp. 213-222
    • Ke, W.1    Menon, P.R.2
  • 10
    • 0034482994 scopus 로고    scopus 로고
    • On invalidation mechanisms for nonrobust delay tests
    • H. Konuk, "On invalidation mechanisms for nonrobust delay tests," in Proc. Int. Test Conf., 2000, pp. 393-399.
    • Proc. Int. Test Conf., 2000 , pp. 393-399
    • Konuk, H.1
  • 12
    • 0027211369 scopus 로고    scopus 로고
    • Zero-suppressed BDD's for set manipulation in combinatorial problems
    • S.-I. Minato, "Zero-suppressed BDD's for set manipulation in combinatorial problems," in Proc. Design Automation Conf., 1993, pp. 272-277.
    • Proc. Design Automation Conf., 1993 , pp. 272-277
    • Minato, S.-I.1
  • 13
    • 0028552967 scopus 로고
    • Calculation of unate cube set algebra using zero-suppressed BDD's
    • ____, "Calculation of unate cube set algebra using zero-suppressed BDD's," Proc. Design Automation Conf., pp. 420-424, 1994.
    • (1994) Proc. Design Automation Conf. , pp. 420-424
    • Minato, S.-I.1
  • 14
    • 0037346987 scopus 로고    scopus 로고
    • Exact path delay fault coverage with fundamental zero-suppressed BDD operations
    • Mar.; to be published
    • S. Padmanaban, M. Michael, and S. Tragoudas, "Exact path delay fault coverage with fundamental zero-suppressed BDD operations," IEEE Trans. Computer-Aided Design, pp. 305-316, Mar. 2003, to be published.
    • (2003) IEEE Trans. Computer-Aided Design , pp. 305-316
    • Padmanaban, S.1    Michael, M.2    Tragoudas, S.3
  • 16
    • 0035472653 scopus 로고    scopus 로고
    • Path delay fault diagnosis in combinational circuits with implicit fault enumeration
    • Oct.
    • P. Pant, Y. C. Hsu, S. K. Gupta, and A. Chatterjee, "Path delay fault diagnosis in combinational circuits with implicit fault enumeration," IEEE Trans. Computer-Aided Design, vol. 20, pp. 1226-1235, Oct. 2001.
    • (2001) IEEE Trans. Computer-Aided Design , vol.20 , pp. 1226-1235
    • Pant, P.1    Hsu, Y.C.2    Gupta, S.K.3    Chatterjee, A.4
  • 17
    • 0023568919 scopus 로고
    • An automatic test pattern generator for the detection of path delay faults
    • S. M. Reddy, C. Lin, and S. Patil, "An automatic test pattern generator for the detection of path delay faults," Proc. Int. Conf. Computer-Aided Design, pp. 284-287, 1987.
    • (1987) Proc. Int. Conf. Computer-Aided Design , pp. 284-287
    • Reddy, S.M.1    Lin, C.2    Patil, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.