Synchrotron x-ray studies of vitreous SiO 2 over Si(001). I. Anisotropic glass contribution

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 4, 2005, Pages

  Castro Colin, M ^a   Donner, W ^a   Moss, S C ^a,b   Islam, Z ^c   Sinha, S K ^d   Nemanich, R ^e   Metzger, H T ^f   Bosecke P ^f   Shulli T ^f  

^a University of Houston   (United States)

^b UNIVERSITY OF HOUSTON   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e NORTH CAROLINA STATE UNIVERSITY   (United States)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ARTICLE; GEOMETRY; SYNCHROTRON; X RAY; X RAY FILM; CRYSTALLIZATION; FILM; MATHEMATICAL ANALYSIS; OSCILLATION;

EID: 15744398695     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.045310     Document Type: Article

References (52)

1. C. J. Sofield and A. M. Stoneham, Semicond. Sci. Technol. 10, 215 (1995).
2. R. M. Wallace and G. Wilk, MRS Bull. 27, 192 (2002).
3. E. P. Gusev, H. C. Lu, T. Gustafsson, E. Garfunkel, Phys. Rev. B 52, 1759 (1995).
4. D. A. Muller, T. Sorsch, S. Moccio. F. H. Baumann, E. Evans-Lutterodt, and G. Timp, Nature (London) 399, 758 (1999).
5. K. Hirose, H. Nohira, T. Koike, K. Sakano, and T. Hattori, Phys. Rev. B 59, 5617 (1999).
6. C. Westphal, Appl. Phys. A: Mater. Sci. Process. 76, 721 (2003).
7. A. Ourmazd, D. W. Taylor, J. A. Rentschler, and J. Bevk, Phys. Rev. Lett. 59, 213 (1987).
8. A. Pasquarello, M. S. Hybertsen, and R. Car, Phys. Rev. Lett. 74, 1024 (1999).
9. A. Demkov and O. F. Sankey, Phys. Rev. Lett. 83, 2038 (1999).
10. Y. Tu and J. Tersoff, Phys. Rev. Lett. 89, 086102 (2002).
11. A. Bongiorno, A. Pasquarello, M. S. Hybertsen, L. C. Feldman, Phys. Rev. Lett. 90, 186101 (2003).
12. K. Tatsumura, T. Watanabe, D. Yamasaki, T. Shimura, M. Umeno, and I. Ohdomari, Phys. Rev. B 69, 085212 (2004).
13. A. C. Wright, J. Non-Cryst. Solids 179, 84 (1994).
14. M. H. Cohen and G. S. Grest, Phys. Rev. B 20, 1077 (1979).
15. L. G. Van Uitert, J. Appl. Phys. 50, 8052 (1979).
16. F. H. Stillinger, Science 267 1935 (1995).
17. X. Xia and P. G. Wolynes, Phys. Rev. Lett. 86 5526 (2001).
18. R. W. Hall and P. G. Wolynes, Phys. Rev. Lett. 90 085505 (2003).
19. Z. P. Lu and C. T. Liu, Phys. Rev. Lett. 91 115505 (2003).
20. R. L. Mozzi and B. E. Warren, J. Appl. Crystallogr. 2, 164 (1969).
21. R. J. Bell and P. Dean, Philos. Mag. 25, 1381 (1972).
22. L. F. Gladden, T. F. Carpenter, and S. R. Elliott, Philos. Mag. B 53, L81 (1986).
23. R. F. Pettifer, R. Dupree, I. Farnan, and U. Sternberg, J. Non-Cryst. Solids 106, 408 (1988).
24. P. Vashishta, R. K. Kalia, J. P. Rino, and I. Ebbsjö, Phys. Rev. B 41, 12197 (1990).
25. J. Neuefeind and K. D. Liss, Ber. Bunsenges. Phys. Chem. 100, 1341 (1996). We believe this to be the most definitive of the studies, especially with regard to the measured bond angle distribution.
26. S. R. Elliott, Physics of Amorphous Materials (Longman, London, 1983).
27. J. L. Robertson and S. C. Moss, J. Non-Cryst. Solids 106, 330 (1988).
28. D. A. Keen and M. Dove, J. Phys.: Condens. Matter 11, 9263 (1999).
29. S. C. Moss, in Amorphous and Liquid Semiconductors, edited by J. Stuke and W. Brening (Taylor and Francis, London, 1973), p. 17.
30. S. C. Moss and D. L. Price, in Physics of Disordered Materials, edited by D. Adler, H. Fritzsche, and S. R. Ovshinsky (Plenum Press, New York, 1985), p. 77.
31. S. R. Elliott, Phys. Rev. Lett. 67, 711 (1991).
32. J. Swenson and L. Borgesson, J. Non-Cryst. Solids 223, 223 (1998).
33. C. Z. Tan and J. Arndt, J. Non-Cryst. Solids 249, 47 (1999).
34. C. Massobrio and A. Pasquarello, J. Chem. Phys. 114, 7976 (2001).
35. S. R. Elliott, Nature (London) 354 445 (1991).
36. B. E. Warren, X-Ray Diffraction (Dover, New York, 1990).
37. J. A. Dura, C. A. Richter, C. F. Majkrzak, and N. V. Nguyen. Appl. Phys. Lett. 73, 2131 (1998).
38. H. Dosch, Phys. Rev. B 35, 2137 (1987).
39. H. Dosch, Critical Phenomena at Surfaces and Interfaces: Evanescent X-ray and Neutron Scattering, edited by G. Hoehler (Springer-Verlag, Heidelberg, 1992).
40. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
41. L. G. Parrat, Phys. Rev. 95, 359 (1954).
42. Y. Okada and Y. Tokumaru, J. Appl. Phys. 56, 314 (1984).
43. Handbook of Chemistry and Physics, 37th ed., edited by C. D. Hodgman, R. C. Weast, and S. M. Selby (Chemical Rubber, Cleveland, OH, 1956).
44. I. Kegel, T. H. Metzger, J. Peisl, J. Stangl, G. Bauer, and D. Smilgies, Phys. Rev. B 60, 2516 (1999).
45. I. Kegel, T. H. Metzger, A. Lroke, J. Peisl, J. Stangl, G. Bauer, K. Nordlund, W. V. Shoenfeld, and P. M. Petroff, Phys. Rev. B 63, 035318 (2001).
46. M. Sztucki, T. H. Metzger, I. Kegel, A. Tilke, J. L. Rouvière, D. Lübbert, J. Arthur, and J. R Patel, J. Appl. Phys. 92 3694 (2002).
47. 2, edited by R. A. B. Devine (Plenum Press, New York, 1987), p. 299.
48. A. Szekeres, K. Christova, and A. Paneva, Philos. Mag. B 65, 961 (1992).
49. S. Tanaka, J. Non-Cryst. Solids 90, 363 (1987).
50. C. Meade, R. J. Hemley, and H. K. Mao, Phys. Rev. Lett. 69, 1387 (1992).
51. H. Reichert, O. Klein, H. Dosch, M. Denk, V. Honkimaki, T. Lippmann, and G. Reiter, Nature (London) 408, 839 (2000).
52. M. Castro-Colin, W. Donner, S. C. Moss, Z. Islam, S. K. Sinha, and R. Nemanich, following paper, Phys. Rev. B 71, 045311 (2004).