Electric measurements by AFM on silicon nanocrystals

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 17, Issue 1-4, 2003, Pages 543-545

  Decossas, S ^a   Mazen, F ^a   Baron, T ^b   Souifi, A ^a   Bremond G ^a  

^a INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

^b Joseph Fourier University   (France)

Author keywords

AFM; SCM; Silicon nanocrystals

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC VARIABLES MEASUREMENT; SCANNING; SILICON;

SCANNING CAPACITANCE MICROSCOPY (SCM);

NANOSTRUCTURED MATERIALS;

EID: 0037395177     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00864-0     Document Type: Conference Paper

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4. Guillemot C.et al. Europhys. Lett. 59(4):2002;566-571.
5. Sze S.M. Physics of Semiconductor Devices. 2nd Edition:1981;Wiley, New York.