Single Point PICA Probing with an Avalanche Photo-Diode

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2001, Pages 23-29

  Bruce, Mike ^a   Goruganthu, Rama R ^a   McBride, Shawn ^a   Bethke, David ^a   Chin, J M ^b  

^a ADVANCED MICRO DEVICES   (United States)

^b Adv Micro Devices ^*  (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CAMERAS; COSTS; FAILURE ANALYSIS; IMAGING SYSTEMS; OPTICAL BEAM SPLITTERS; PHOTODIODES; PHOTONS; QUANTUM EFFICIENCY; TIMING JITTER; TRANSISTORS;

AVALANCHE PHOTO-DIODES (APD); PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA); RING OSCILLATOR CIRCUITS;

INTEGRATED CIRCUITS;

EID: 1542270752     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)

1. J.C. Tsang and J.A. Kash, "Picosecond Hot Electron Light Emission from Submicron Complementary Metal-Oxide-Semiconductor Circuits," Applied Phys. Lett. 70, 889 (1997).
2. J.A. Kash and J.C. Tsang, "Dynamical Internal Testing of CMOS Circuits Using Hot Luminescence", IEEE Electronic Device Lett. EDL-18, 330 (1997).
3. D. Knebel, P. Sanda, M. McManus, J.A. Kash, J.C. Tsang, D. Vallet, L. Huisman, P. Nigh, R. Rizzolo, P. Song, F. Motika, "Diagnosis and Characterization of Timing-Related Defects by Time-Dependent Light Emission," Proceedings of 1998 IEEE International Test Conference, p. 733 (1998).
4. th International Symposium for Testing and Failure Analysis p. 483 (1998).
5. th International Symposium for Testing and Failure Analysis p. 35 (1999).
6. S. Tam and C. Hu, "Hot-Electron-Induced Photon and Photocarrier Generation in Silicon MOSFET's", IEEE Trans. Electron Dev. ED-31, 1264 (1984).
7. Toriumi, M. Yoshimi, M. Iwase, Y. Akiyama, K. Taniguchi, "A Study of Photon Emission from n-Channel MOSFET's", IEEE Trans. Electron Dev. ED-34, 1501 (1987).
8. C.F. Hawkins, J.M. Soden, E.I. Cole, E.S. Snyder, "The Use of Light Emission in Failure Analysis of CMOS ICs", Proceedings from the 1990 International Symposium for Testing and Failure Analysis p. 55 (1990).
9. V.J. Brace, "Energy Resolved Emission Microscope", Proceedings of the 1993 IEEE International Reliability Physics Symposium, p. 178 (1993).
10. Y. Uraoka, N. Tsutsu, T. Morii, K. Tsuji, "Hot Carrier Evaluation of MOSFET's in ULSI Circuits Using the Photon Emission Method", IEEE Trans. Electron Dev. 40, 1426 (1993).
11. th International Symposium for Testing and Failure Analysis p. 57 (1999).
12. H.Y. Fan and M. Becker, "Infrared Optical Properties of Silicon and Germanium" in Semi-Conducting Materials, Proceedings of a Conference held at the University of Reading under the auspices of the International Union of Pure and Applied Physics in cooperation with the Royal Society, H.K. Henisch, ed., p. 132 (Butterworths Scientific Publications Ltd. 1951).
13. W. Spitzer and H.Y. Fan, "Infrared Absorption in n-type Silicon", Phys. Rev. 108, 268 (1957).
14. S.E. Aw, H.S. Tan, and C.K. Ong, "Optical Absorption Measurements of Band-Gap Shrinkage in Moderately and Heavily Doped Silicon" J. Phys.: Condensed Matter 3, 8213 (1991).
15. th International Symposium for Testing and Failure Analysis p. 1 (1992).
16. F. Stelleri, F. Zappa, S. Cova, and L. Vendrame, "Tools for Non-Invasive Optical Characterization of CMOS Circuits," 1999 International Electron Device Meeting: Technical Digest of Papers, p. 487 (1999).
17. E.L. Dereniak and G.D. Boreman, Infrared Detectors and Systems (John Wiley & Sons 1996).
18. Burle Electro-Optics Handbook, Publication TP-135 (Burle Industries, Inc. 1974).
19. D.V. O'Conner and D. Phillips, Time-Correlated Single Photon Counting (Academic Press 1984).
20. th International Symposium for Testing and Failure Analysis p. 155 (2000).
21. A. Spinelli, M.A. Ghioni, S.D. Cova, and L.M. Davis "Avalanche Detector with Ultraclean Response for Time-Resolved Photon Counting," IEEE J. Quantum Electron. QE-34, 817 (1998).
22. S. Cova, M. Ghioni, A. Lacaita, C. Samori, and F. Zappa, "Avalanche Photodiodes and Quenching Circuits for Single-Photon Detection," Appl. Opt. 35, 1956 (1996).
23. For instance, see J.M Rabaey, Digital Integrated Circuits (Prentice Hall 1996), pp. 123 and 243.
24. S. Cova, A. Lacaita, F. Zappa, and P. Lovati, "Avalanche photodiodes for near-infrared photon counting" in Advances in Fluorescence Sensing Technology II, Proceedings of SPIE Vol. 2388, p. 56 (1995).
25. A. Lacaita, F. Zappa, S. Cova, and P. Lovati, "Single-photon detection beyond 1μm: performance of commercially available InGaAs/InP detectors," Appl. Opt. 35, 2986 (1996).